Analysis Toolkits

The SVXR Data Analysis Toolkit revolutionizes the use of transmissive inspection technology in semiconductor packaging by eliminating manual processing and interpretation of X-ray images.

In real time as the system captures data from samples under test, SVXR’s proprietary analysis tools locate and analyze features of interest using machine learning techniques.

Initial teaching can be accomplished on a limited sample size to get to production quickly. With the addition of supervised learning from programmed defects or offline analysis, process control and reject detection criteria can be tuned to the user’s specifications.

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